BRASS

References


BIRKENSTOCK, J., FISCHER, R.X., MESSNER, T. (2003): BRASS 2003: The Bremen Rietveld Analysis and Structure Suite. Ber. DMG, Beih. z. Eur. J. Mineral. 15(1), 21. (Talk)

BURZLAFF, H., HOUNTAS, A. (1982): Computer program for the derivation of symmetry operations from the spacegroup symbols. J. Appl. Crystallogr. 15, 464-467.

FISCHER, R.X. (1985).: STRUPLO84, a Fortran plot program for crystal structure illustrations in polyhedral representation. J. Appl. Crystallogr. 18, 258-262.

FISCHER, R.X., MESSNER, T. (2003): STRUPLO 2003. A new program for crystal structure drawing. Ber. DMG, Beih. z. Eur. J. Mineral. 15(1), 54. (Poster, pdf)

FISCHER, R.X., MESSNER, T., KASSNER, D. (2000): BRASS: The Bremen Rietveld Analysis and Structure Suite. Berichte aus Arbeitskreisen der DGK Nr. 9. VII. Workshop Powder Diffraction. Structure Determination and Refinement from Powder Diffraction Data. Ed. R.E. Dinnebier, Deutsche Gesellschaft für Kristallographie (2000) 201-208.

FISCHER, R.X., LENGAUER, C., TILLMANNS, E., ENSINK, R.J., REISS, C.A., FANTNER, E.J. (1993): PC-Rietveld plus, a comprehensive Rietveld analysis package for PC. Materials Science Forum 133-136 (1993) 287-292.

HILL, R.J., HOWARD, C.J. (1986): A computer program for Rietveld analysis of fixed wavelength X-ray and neutron powder diffraction patterns. Australian Atomic Energy Commission Research Establishment, Research Report M112 (1986).

MESSNER, T., FISCHER, R.X. (2003): Graphical representation of Fourier maps and grid search analyses. Zentrallabor für Kristallographie und Angewandte Materialwissenschaften, Fachbereich Geowissenschaften, University of Bremen.

RIETVELD, H.M. (1967a): Line profiles of neutron powder diffraction peaks for structure refinement. Acta Crystallogr. 22, 151-152.

RIETVELD, H.M. (1967b): An ALGOL program for the refinement of nuclear and magnetic structures by the profile method. Reactor Centrum Nederland, Research Report 1967.

RIETVELD, H.M. (1969): A profile refinement method for nuclear and magnetic structures. J. Appl. Crystallogr. 2, 65.

WILES, D.B., YOUNG, R.A. (1981): A new computer program for Rietveld analysis of X-ray powder diffraction patterns. J. Appl. Crystallogr. 14, 149-151.

Fischer, R.X., Burianek, M., Shannon, R.D. (2018): POLARIO, a computer program for calculating refractive indices from chemical compositions. American Mineralogist, in press (DOI 10.2138/am-2018-6587)


aktualisiert am 2. Oktober 2023 von T. Messner, FB 05, Universität Bremen